Cyber Physical Test System : A novel approach in testing for the Embedded Systems Industry

Schulz, Peter; Wolff, Carsten

doi:10.1109/AUTOTESTCON43700.2019.8961895

DC Element	Wert	Sprache
dc.contributor.author	Schulz, Peter	-
dc.contributor.author	Wolff, Carsten	-
dc.date.accessioned	2021-07-13T07:05:51Z	-
dc.date.available	2021-07-13T07:05:51Z	-
dc.date.issued	2019	-
dc.identifier.isbn	978-1-7281-2832-0	en_US
dc.identifier.isbn	978-1-72812-833-7	en_US
dc.identifier.uri	http://hdl.handle.net/20.500.12738/11229	-
dc.description.sponsorship	Bundesministerium für Wirtschaft und Energie	en_US
dc.language.iso	en_US	en_US
dc.publisher	IEEE	en_US
dc.subject	ATE	en_US
dc.subject	cloud computing	en_US
dc.subject	CPS	en_US
dc.subject	FPGA	en_US
dc.subject	functional testing	en_US
dc.subject	IoT	en_US
dc.subject	SoPC	en_US
dc.subject.ddc	620: Ingenieurwissenschaften	en_US
dc.title	Cyber Physical Test System : A novel approach in testing for the Embedded Systems Industry	en_US
dc.type	inProceedings	en_US
dc.relation.conference	IEEE AUTOTESTCON 2019	en_US
local.contributorCorporate.editor	Institute of Electrical and Electronics Engineers	-
tuhh.oai.show	true	en_US
tuhh.publication.institute	Fachhochschule Dortmund	en_US
tuhh.publisher.doi	10.1109/AUTOTESTCON43700.2019.8961895	-
tuhh.publisher.url	https://api.elsevier.com/content/abstract/scopus_id/85078537535	-
tuhh.relation.ispartofseries	2019 IEEE AUTOTESTCON proceedings	en_US
tuhh.type.opus	InProceedings (Aufsatz / Paper einer Konferenz etc.)	-
dc.relation.project	Cyber Physical Test System	en_US
dc.type.casrai	Conference Paper	-
dc.type.dini	contributionToPeriodical	-
dc.type.driver	contributionToPeriodical	-
dc.type.status	info:eu-repo/semantics/publishedVersion	en_US
dcterms.DCMIType	Text	-
tuhh.container.articlenumber	8961895	-
item.creatorGND	Schulz, Peter	-
item.creatorGND	Wolff, Carsten	-
item.fulltext	No Fulltext	-
item.creatorOrcid	Schulz, Peter	-
item.creatorOrcid	Wolff, Carsten	-
item.seriesref	2019 IEEE AUTOTESTCON proceedings	-
item.grantfulltext	none	-
item.cerifentitytype	Publications	-
item.tuhhseriesid	2019 IEEE AUTOTESTCON proceedings	-
item.languageiso639-1	en_US	-
item.openairecristype	http://purl.org/coar/resource_type/c_5794	-
item.openairetype	inProceedings	-
crisitem.author.dept	Department Informations- und Elektrotechnik	-
crisitem.author.orcid	0009-0009-4830-1498	-
crisitem.author.parentorg	Fakultät Technik und Informatik	-
Enthalten in den Sammlungen:	Publications without full text