| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Schulz, Peter | - |
| dc.contributor.author | Wolff, Carsten | - |
| dc.date.accessioned | 2021-07-13T07:05:51Z | - |
| dc.date.available | 2021-07-13T07:05:51Z | - |
| dc.date.issued | 2019 | - |
| dc.identifier.isbn | 978-1-7281-2832-0 | en_US |
| dc.identifier.isbn | 978-1-72812-833-7 | en_US |
| dc.identifier.uri | http://hdl.handle.net/20.500.12738/11229 | - |
| dc.description.sponsorship | Bundesministerium für Wirtschaft und Energie | en_US |
| dc.language.iso | en_US | en_US |
| dc.publisher | IEEE | en_US |
| dc.subject | ATE | en_US |
| dc.subject | cloud computing | en_US |
| dc.subject | CPS | en_US |
| dc.subject | FPGA | en_US |
| dc.subject | functional testing | en_US |
| dc.subject | IoT | en_US |
| dc.subject | SoPC | en_US |
| dc.subject.ddc | 620: Ingenieurwissenschaften | en_US |
| dc.title | Cyber Physical Test System : A novel approach in testing for the Embedded Systems Industry | en_US |
| dc.type | inProceedings | en_US |
| dc.relation.conference | IEEE AUTOTESTCON 2019 | en_US |
| local.contributorCorporate.editor | Institute of Electrical and Electronics Engineers | - |
| tuhh.oai.show | true | en_US |
| tuhh.publication.institute | Fachhochschule Dortmund | en_US |
| tuhh.publisher.doi | 10.1109/AUTOTESTCON43700.2019.8961895 | - |
| tuhh.publisher.url | https://api.elsevier.com/content/abstract/scopus_id/85078537535 | - |
| tuhh.relation.ispartofseries | 2019 IEEE AUTOTESTCON proceedings | en_US |
| tuhh.type.opus | InProceedings (Aufsatz / Paper einer Konferenz etc.) | - |
| dc.relation.project | Cyber Physical Test System | en_US |
| dc.type.casrai | Conference Paper | - |
| dc.type.dini | contributionToPeriodical | - |
| dc.type.driver | contributionToPeriodical | - |
| dc.type.status | info:eu-repo/semantics/publishedVersion | en_US |
| dcterms.DCMIType | Text | - |
| tuhh.container.articlenumber | 8961895 | - |
| item.creatorGND | Schulz, Peter | - |
| item.creatorGND | Wolff, Carsten | - |
| item.fulltext | No Fulltext | - |
| item.creatorOrcid | Schulz, Peter | - |
| item.creatorOrcid | Wolff, Carsten | - |
| item.seriesref | 2019 IEEE AUTOTESTCON proceedings | - |
| item.grantfulltext | none | - |
| item.cerifentitytype | Publications | - |
| item.tuhhseriesid | 2019 IEEE AUTOTESTCON proceedings | - |
| item.languageiso639-1 | en_US | - |
| item.openairecristype | http://purl.org/coar/resource_type/c_5794 | - |
| item.openairetype | inProceedings | - |
| crisitem.author.dept | Department Informations- und Elektrotechnik | - |
| crisitem.author.orcid | 0009-0009-4830-1498 | - |
| crisitem.author.parentorg | Fakultät Technik und Informatik | - |
| Appears in Collections: | Publications without full text | |
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