Verlagslink DOI: 10.1145/3695247
10.48550/arXiv.2301.06804
Titel: A review of techniques for ageing detection and monitoring on embedded systems
Sprache: Englisch
Autorenschaft: Lanzieri Rodriguez, Leandro 
Martino, Gianluca 
Fey, Goerschwin 
Schlarb, Holger 
Schmidt, Thomas C.  
Wählisch, Matthias 
Schlagwörter: Hardware Ageing; Dependable Systems; Failure Monitoring
Erscheinungsdatum: 7-Okt-2024
Verlag: Association for Computing Machinery
Zeitschrift oder Schriftenreihe: ACM computing surveys 
Zeitschriftenband: 57
Zeitschriftenausgabe: 1
Anfangsseite: 24:1
Endseite: 24:34
Zusammenfassung: 
Embedded digital devices are progressively deployed in dependable or safety-critical systems. These devices undergo significant hardware ageing, particularly in harsh environments. This increases their likelihood of failure. It is crucial to understand ageing processes and to detect hardware degradation early for guaranteeing system dependability. In this survey, we review the core ageing mechanisms, and identify and categorize general working principles of ageing detection and monitoring techniques for Commercial-Off-the-Shelf (COTS) components that are prevalent in embedded systems: Field Programmable Gate Arrays (FPGAs), microcontrollers, Systems-on-Chips (SoCs), and their power supplies. From our review, we find that online techniques are more widely applied on FPGAs than on other components, and see a rising trend towards machine learning application for analysing hardware ageing. Based on the reviewed literature, we identify research opportunities and potential directions of interest in the field. With this work, we intend to facilitate future research by systematically presenting all main approaches in a concise way.
URI: http://hdl.handle.net/20.500.12738/14884
ISSN: 1557-7341
Begutachtungsstatus: Diese Version hat ein Peer-Review-Verfahren durchlaufen (Peer Review)
Einrichtung: Department Informatik 
Fakultät Technik und Informatik 
Dokumenttyp: Zeitschriftenbeitrag
Hinweise zur Quelle: Preprint: https://doi.org/10.48550%2FarXiv.2301.06804. Verlagsversion: https://doi.org/10.1145%2F3695247.
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