Publisher DOI: | 10.48550/arXiv.2301.06804 | Title: | A review of techniques for ageing detection and monitoring on embedded systems | Language: | English | Authors: | Lanzieri Rodriguez, Leandro Martino, Gianluca Fey, Goerschwin Schlarb, Holger Schmidt, Thomas C. Wählisch, Matthias |
Issue Date: | 17-Jan-2023 | Publisher: | Arxiv.org | Journal or Series Name: | De.arxiv.org | Abstract: | Embedded digital devices, such as Field-Programmable Gate Arrays (FPGAs) and Systems on Chip (SoCs), are increasingly used in dependable or safety-critical systems. These commodity devices are subject to notable hardware ageing, which makes failures likely when used for an extended time. It is of vital importance to understand ageing processes and to detect hardware degradations early. In this survey, we describe the fundamental ageing mechanisms and review the main techniques for detecting ageing in FPGAs, microcontrollers, SoCs, and power supplies. The main goal of this work is to facilitate future research efforts in this field by presenting all main approaches in an organized way. |
URI: | http://hdl.handle.net/20.500.12738/14884 | Review status: | Only preprints: This version has not yet been reviewed | Institute: | Department Informatik Fakultät Technik und Informatik |
Type: | Preprint |
Appears in Collections: | Publications without full text |
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