Publisher DOI: 10.48550/arXiv.2301.06804
Title: A review of techniques for ageing detection and monitoring on embedded systems
Language: English
Authors: Lanzieri Rodriguez, Leandro 
Martino, Gianluca 
Fey, Goerschwin 
Schlarb, Holger 
Schmidt, Thomas C.  
Wählisch, Matthias 
Issue Date: 17-Jan-2023
Publisher: Arxiv.org
Journal or Series Name: De.arxiv.org 
Abstract: 
Embedded digital devices, such as Field-Programmable Gate Arrays (FPGAs) and Systems on Chip (SoCs), are increasingly used in dependable or safety-critical systems. These commodity devices are subject to notable hardware ageing, which makes failures likely when used for an extended time. It is of vital importance to understand ageing processes and to detect hardware degradations early. In this survey, we describe the fundamental ageing mechanisms and review the main techniques for detecting ageing in FPGAs, microcontrollers, SoCs, and power supplies. The main goal of this work is to facilitate future research efforts in this field by presenting all main approaches in an organized way.
URI: http://hdl.handle.net/20.500.12738/14884
Review status: Only preprints: This version has not yet been reviewed
Institute: Department Informatik 
Fakultät Technik und Informatik 
Type: Preprint
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