DC Field | Value | Language |
---|---|---|
dc.contributor.author | Schulz, Peter | - |
dc.contributor.author | Sleibi, Noura | - |
dc.contributor.author | Trimech, Sami | - |
dc.contributor.author | Aldaghamin, Areej | - |
dc.contributor.author | Wolff, Carsten | - |
dc.date.accessioned | 2024-03-19T16:44:41Z | - |
dc.date.available | 2024-03-19T16:44:41Z | - |
dc.date.issued | 2023-11-02 | - |
dc.identifier.isbn | 979-8-3503-0028-4 | en_US |
dc.identifier.isbn | 979-8-3503-0029-1 | en_US |
dc.identifier.uri | http://hdl.handle.net/20.500.12738/15280 | - |
dc.description.abstract | This research paper presents the progress made in the Cyber Physical Test System (CPTS) project, which aims to provide a cost-effective and secure automatic test equipment (ATE) for small and medium-sized enterprises (SMEs) in the embedded systems industry. CPTS allows outsourced testing while protecting the intellectual property (IP) of the SMEs. This paper discusses the development of low-cost main device hardware, the establishment of connectivity between the main device hardware and the test cloud, and the implementation of test execution plans for test program sets (TPSs). Furthermore, it explores typical industrial application scenarios for the CPTS, highlighting its benefits and advantages in industrial settings. | en |
dc.language.iso | en | en_US |
dc.publisher | IEEE | en_US |
dc.subject | Cyber Physical Test System | en_US |
dc.subject | ATE | en_US |
dc.subject | embedded systems | en_US |
dc.subject | testing | en_US |
dc.subject | outsourcing | en_US |
dc.subject | intellectual property | en_US |
dc.subject.ddc | 600: Technik | en_US |
dc.title | Cloud-based production testing with a cyber physical test system | en |
dc.type | inProceedings | en_US |
dc.relation.conference | IEEE AUTOTESTCON 2023 | en_US |
dc.description.version | PeerReviewed | en_US |
local.contributorCorporate.editor | Institute of Electrical and Electronics Engineers | - |
tuhh.oai.show | true | en_US |
tuhh.publication.institute | Fakultät Technik und Informatik | en_US |
tuhh.publication.institute | Department Informations- und Elektrotechnik | en_US |
tuhh.publisher.doi | 10.1109/AUTOTESTCON47464.2023.10296208 | - |
tuhh.relation.ispartofseries | AUTOTESTCON 2023 conference proceedings : IEEE AUTOTESTCON 2023, August 28-31, 2023, National Harbor, Maryland, Gaylord National Convention Center | en_US |
tuhh.type.opus | InProceedings (Aufsatz / Paper einer Konferenz etc.) | - |
dc.relation.project | Cyber Physical Test System | en_US |
dc.type.casrai | Conference Paper | - |
dc.type.dini | contributionToPeriodical | - |
dc.type.driver | contributionToPeriodical | - |
dc.type.status | info:eu-repo/semantics/publishedVersion | en_US |
dcterms.DCMIType | Text | - |
local.comment.external | Project "Cyber Physical Test System (CPTS)": The CPTS consortium received funding from the German Federal Ministry for Economic Affairs and Energy through the so-called ZIM initiative (project number ZF4595401BZ8). | en_US |
item.seriesref | AUTOTESTCON 2023 conference proceedings : IEEE AUTOTESTCON 2023, August 28-31, 2023, National Harbor, Maryland, Gaylord National Convention Center | - |
item.tuhhseriesid | AUTOTESTCON 2023 conference proceedings : IEEE AUTOTESTCON 2023, August 28-31, 2023, National Harbor, Maryland, Gaylord National Convention Center | - |
item.creatorGND | Schulz, Peter | - |
item.creatorGND | Sleibi, Noura | - |
item.creatorGND | Trimech, Sami | - |
item.creatorGND | Aldaghamin, Areej | - |
item.creatorGND | Wolff, Carsten | - |
item.languageiso639-1 | en | - |
item.cerifentitytype | Publications | - |
item.openairecristype | http://purl.org/coar/resource_type/c_5794 | - |
item.creatorOrcid | Schulz, Peter | - |
item.creatorOrcid | Sleibi, Noura | - |
item.creatorOrcid | Trimech, Sami | - |
item.creatorOrcid | Aldaghamin, Areej | - |
item.creatorOrcid | Wolff, Carsten | - |
item.fulltext | No Fulltext | - |
item.grantfulltext | none | - |
item.openairetype | inProceedings | - |
crisitem.author.dept | Department Informations- und Elektrotechnik | - |
crisitem.author.parentorg | Fakultät Technik und Informatik | - |
Appears in Collections: | Publications without full text |
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