DC FieldValueLanguage
dc.contributor.authorWallentin, Jesper-
dc.contributor.authorOsterhoff, Markus-
dc.contributor.authorWilke, Robin N.-
dc.contributor.authorPersson, Karl-Magnus-
dc.contributor.authorWernersson, Lars-Erik-
dc.contributor.authorSprung, Michael-
dc.contributor.authorSalditt, Tim-
dc.date.accessioned2024-04-25T08:54:35Z-
dc.date.available2024-04-25T08:54:35Z-
dc.date.issued2014-11-24-
dc.identifier.issn1530-6992en_US
dc.identifier.urihttp://hdl.handle.net/20.500.12738/15607-
dc.language.isoenen_US
dc.publisherAmerican Chemical Society (ACS)en_US
dc.relation.ispartofNano lettersen_US
dc.subjectNanowiresen_US
dc.subjectX-raysen_US
dc.subjectdetectoren_US
dc.subject.ddc530: Physiken_US
dc.titleHard X-ray detection using a single 100 nm diameter nanowireen
dc.typeArticleen_US
dc.description.versionPeerRevieweden_US
tuhh.container.endpage7076en_US
tuhh.container.issue12en_US
tuhh.container.startpage7071en_US
tuhh.container.volume14en_US
tuhh.oai.showtrueen_US
tuhh.publication.instituteGeorg-August-Universität Göttingenen_US
tuhh.publisher.doi10.1021/nl5040545-
tuhh.type.opus(wissenschaftlicher) Artikel-
dc.type.casraiJournal Article-
dc.type.diniarticle-
dc.type.driverarticle-
dc.type.statusinfo:eu-repo/semantics/publishedVersionen_US
dcterms.DCMITypeText-
item.creatorOrcidWallentin, Jesper-
item.creatorOrcidOsterhoff, Markus-
item.creatorOrcidWilke, Robin N.-
item.creatorOrcidPersson, Karl-Magnus-
item.creatorOrcidWernersson, Lars-Erik-
item.creatorOrcidSprung, Michael-
item.creatorOrcidSalditt, Tim-
item.grantfulltextnone-
item.fulltextNo Fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.openairetypeArticle-
item.creatorGNDWallentin, Jesper-
item.creatorGNDOsterhoff, Markus-
item.creatorGNDWilke, Robin N.-
item.creatorGNDPersson, Karl-Magnus-
item.creatorGNDWernersson, Lars-Erik-
item.creatorGNDSprung, Michael-
item.creatorGNDSalditt, Tim-
item.languageiso639-1en-
item.cerifentitytypePublications-
crisitem.author.deptDepartment Maschinenbau und Produktion-
crisitem.author.orcid0000-0002-9263-1904-
crisitem.author.parentorgFakultät Technik und Informatik-
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