DC ElementWertSprache
dc.contributor.authorHettwer, Benjamin-
dc.contributor.authorPetersen, Johannes-
dc.contributor.authorGehrer, Stefan-
dc.contributor.authorNeumann, Heike-
dc.contributor.authorGüneysu, Tim-
dc.date.accessioned2024-05-30T13:26:01Z-
dc.date.available2024-05-30T13:26:01Z-
dc.date.issued2019-05-16-
dc.identifier.isbn978-3-9819263-2-3en_US
dc.identifier.isbn978-1-7281-0331-0en_US
dc.identifier.urihttp://hdl.handle.net/20.500.12738/15855-
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.subjectfault at-tacksen_US
dc.subjectFPGAsen_US
dc.subjectpartial reconfigurationen_US
dc.subjectPhysical attacken_US
dc.subjectside-channel attacksen_US
dc.subject.ddc600: Techniken_US
dc.titleSecuring cryptographic circuits by exploiting implementation diversity and partial reconfiguration on FPGAsen
dc.typeinProceedingsen_US
dc.relation.conferenceDesign, Automation & Test in Europe Conference & Exhibition 2019en_US
dc.identifier.scopus2-s2.0-85066607311en
dc.contributor.departmentRuhr-Universitat Bochumen
dc.contributor.departmentHochschule für Angewandte Wissenschaften Hamburgen
dc.contributor.departmentRobert Bosch GmbHen
dc.contributor.departmentHochschule für Angewandte Wissenschaften Hamburgen
dc.contributor.departmentRuhr-Universitat Bochumen
dc.description.versionPeerRevieweden_US
tuhh.container.endpage263en_US
tuhh.container.startpage260en_US
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tuhh.publication.instituteDepartment Informations- und Elektrotechniken_US
tuhh.publication.instituteFakultät Technik und Informatiken_US
tuhh.publisher.doi10.23919/DATE.2019.8714801-
tuhh.relation.ispartofseriesProceedings of the 2019 Design, Automation & Test in Europe (DATE) : 25-29 March 2019, Florence, Italyen_US
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dc.contributor.departmentcityBochumen
dc.contributor.departmentcityHamburgen
dc.contributor.departmentcityGerlingenen
dc.contributor.departmentcityHamburgen
dc.contributor.departmentcityBochumen
dc.contributor.departmentcountryGermanyen
dc.contributor.departmentcountryGermanyen
dc.contributor.departmentcountryGermanyen
dc.contributor.departmentcountryGermanyen
dc.contributor.departmentcountryGermanyen
dc.contributor.departmenturlhttps://api.elsevier.com/content/affiliation/affiliation_id/60005322en
dc.contributor.departmenturlhttps://api.elsevier.com/content/affiliation/affiliation_id/60032697en
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tuhh.container.articlenumber8714801en
dc.funding.number16KIS0606Ken
dc.funding.sponsorBundesministerium für Bildung und Forschungen
dc.relation.acronymBMBFen
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item.openairetypeinProceedings-
item.tuhhseriesidProceedings of the 2019 Design, Automation & Test in Europe (DATE) : 25-29 March 2019, Florence, Italy-
item.creatorGNDHettwer, Benjamin-
item.creatorGNDPetersen, Johannes-
item.creatorGNDGehrer, Stefan-
item.creatorGNDNeumann, Heike-
item.creatorGNDGüneysu, Tim-
item.languageiso639-1en-
item.creatorOrcidHettwer, Benjamin-
item.creatorOrcidPetersen, Johannes-
item.creatorOrcidGehrer, Stefan-
item.creatorOrcidNeumann, Heike-
item.creatorOrcidGüneysu, Tim-
item.cerifentitytypePublications-
item.seriesrefProceedings of the 2019 Design, Automation & Test in Europe (DATE) : 25-29 March 2019, Florence, Italy-
crisitem.author.deptDepartment Informations- und Elektrotechnik-
crisitem.author.parentorgFakultät Technik und Informatik-
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