Publisher DOI: | 10.1109/OJPEL.2024.3389105 | Title: | Investigating humidity transfer in IGBT modules : an integrated experimental and simulation approach | Language: | English | Authors: | Titova, Valeriya Lapke, Martin |
Keywords: | finite element methods; humidity measurement; insulated gate bipolar transistors; inverters; Modeling; moisture; photovoltaic power systems; semiconductor device reliability; silicone insulation; simulation | Issue Date: | 16-Apr-2024 | Publisher: | IEEE | Journal or Series Name: | IEEE open journal of power electronics : an open access publication of the IEEE Power Electronics Society | Volume: | 5 | Startpage: | 575 | Endpage: | 582 | Abstract: | This study presents a novel, integrated approach to investigating and characterizing the impact of humidity on Insulated-Gate Bipolar Transistors (IGBTs) within large-scale inverter systems. Combining meticulously designed experimental setups and advanced finite element simulations, we delve deep into the complex dynamics of moisture transfer within IGBT modules. Our research demonstrates a meticulously designed experimental setup within a controlled climate chamber, enabling a comprehensive characterization process of the humidity transfer into the IGBT module. The proposed method allows for a detailed study of the moisture distribution as well as the effect of the temperature on the moisture within an IGBT module. We leverage the advanced capabilities of commercial finite element software to complement our experimental findings. These simulations enable a deeper understanding of the moisture distribution's symmetries and provide invaluable insights into simplifying the complex simulations. By integrating these diverse methodologies, we develop a comprehensive approach that deciphers the spatial distribution of humidity within the module and its real-time responses to environmental conditions. This integrated approach holds an immense potential for analyzing optimal system performance and facilitating self-optimization of the inverter by predicting stress induced by humidity. |
URI: | http://hdl.handle.net/20.500.12738/15867 | ISSN: | 2644-1314 | Review status: | This version was peer reviewed (peer review) | Institute: | Department Informations- und Elektrotechnik Fakultät Technik und Informatik |
Type: | Article |
Appears in Collections: | Publications without full text |
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