Could an open-source approach to test systems help the embedded systems industry?

Schulz, Peter; Sleibi, Noura; Wolff, Carsten; Hensen, Christian

doi:10.1109/AUTOTESTCON47465.2024.10697501

Publisher DOI:	10.1109/AUTOTESTCON47465.2024.10697501
Title:	Could an open-source approach to test systems help the embedded systems industry?
Language:	English
Authors:	Schulz, Peter Sleibi, Noura Wolff, Carsten Hensen, Christian
Other :	Institute of Electrical and Electronics Engineers
Keywords:	Cyber Physical Test System (CPTS); Embedded Systems; Open Access; Automatic Test Equipment (ATE); Test Program Set (TPS); Field Programmable Gate Array (FPGA)
Issue Date:	2-Oct-2024
Publisher:	IEEE
Part of Series:	2024 IEEE Autotestcon : conference proceedings
Project:	Open Access Community als Innovationstreiber für das Cyber-Physical Test System; Teilprojekt B
Conference:	Autotestcon 2024
URI:	https://hdl.handle.net/20.500.12738/16726
ISBN:	979-8-3503-4943-6 979-8-3503-4944-3
Review status:	This version was peer reviewed (peer review)
Institute:	Fakultät Technik und Informatik Department Informations- und Elektrotechnik Forschungs- und Transferzentrum Future Mobility and Acoustics
Type:	Konferenzveröffentlichung
Hinweise zur Quelle:	Project "DATIPilot - Sprint - OpenCPTS: Open Access Community als Innovationstreiber für das Cyber-Physical Test System; Teilprojekt B", funded by the German Federal Ministry of Education and Research, project number 03DPS1180B.
Sponsor / Fördernde Einrichtung:	Bundesministerium für Bildung und Forschung
Enthalten in den Sammlungen:	Publications without full text