| Publisher DOI: | 10.1109/AUTOTESTCON47465.2024.10697501 | Title: | Could an open-source approach to test systems help the embedded systems industry? | Language: | English | Authors: | Schulz, Peter  Sleibi, Noura Wolff, Carsten Hensen, Christian |
Other : | Institute of Electrical and Electronics Engineers | Keywords: | Cyber Physical Test System (CPTS); Embedded Systems; Open Access; Automatic Test Equipment (ATE); Test Program Set (TPS); Field Programmable Gate Array (FPGA) | Issue Date: | 2-Oct-2024 | Publisher: | IEEE | Part of Series: | 2024 IEEE Autotestcon : conference proceedings | Conference: | Autotestcon 2024 | URI: | https://hdl.handle.net/20.500.12738/16726 | ISBN: | 979-8-3503-4943-6 979-8-3503-4944-3 |
Review status: | This version was peer reviewed (peer review) | Institute: | Fakultät Technik und Informatik Department Informations- und Elektrotechnik Forschungs- und Transferzentrum Future Air Mobility |
Type: | Chapter/Article (Proceedings) | Additional note: | Project "DATIPilot - Sprint - OpenCPTS: Open Access Community als Innovationstreiber für das Cyber-Physical Test System; Teilprojekt B", funded by the German Federal Ministry of Education and Research, project number 03DPS1180B. | Funded by: | Bundesministerium für Bildung und Forschung |
| Appears in Collections: | Publications without full text |
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