| Publisher DOI: | 10.1109/AUTOTESTCON47465.2024.10697506 | Title: | FPGA-based digital twins to evaluate test coverage of behavioral failure modes | Language: | English | Authors: | Schulz, Peter  Ungar, Louis Y. Bahrampour, Braum S. |
Other : | Institute of Electrical and Electronics Engineers | Keywords: | Automatic Test Equipment (ATE); Digital Twin; Field Programmable Gate Array (FPGA); Failure Modes Effect Analysis (FMEA); Test Coverage | Issue Date: | 2-Oct-2024 | Publisher: | IEEE | Part of Series: | 2024 IEEE Autotestcon : conference proceedings | Conference: | Autotestcon 2024 | URI: | https://hdl.handle.net/20.500.12738/16727 | ISBN: | 979-8-3503-4943-6 979-8-3503-4944-3 |
Review status: | This version was peer reviewed (peer review) | Institute: | Fakultät Technik und Informatik Department Informations- und Elektrotechnik Forschungs- und Transferzentrum Future Air Mobility |
Type: | Chapter/Article (Proceedings) |
| Appears in Collections: | Publications without full text |
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