| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Schulz, Peter | - |
| dc.contributor.author | Ungar, Louis Y. | - |
| dc.contributor.author | Bahrampour, Braum S. | - |
| dc.date.accessioned | 2024-12-12T15:14:33Z | - |
| dc.date.available | 2024-12-12T15:14:33Z | - |
| dc.date.issued | 2024-10-02 | - |
| dc.identifier.isbn | 979-8-3503-4943-6 | en_US |
| dc.identifier.isbn | 979-8-3503-4944-3 | en_US |
| dc.identifier.uri | https://hdl.handle.net/20.500.12738/16727 | - |
| dc.language.iso | en | en_US |
| dc.publisher | IEEE | en_US |
| dc.subject | Automatic Test Equipment (ATE) | en_US |
| dc.subject | Digital Twin | en_US |
| dc.subject | Field Programmable Gate Array (FPGA) | en_US |
| dc.subject | Failure Modes Effect Analysis (FMEA) | en_US |
| dc.subject | Test Coverage | en_US |
| dc.subject.ddc | 620: Ingenieurwissenschaften | en_US |
| dc.title | FPGA-based digital twins to evaluate test coverage of behavioral failure modes | en |
| dc.type | inProceedings | en_US |
| dc.relation.conference | Autotestcon 2024 | en_US |
| dc.description.version | PeerReviewed | en_US |
| local.contributorCorporate.editor | Institute of Electrical and Electronics Engineers | - |
| tuhh.oai.show | true | en_US |
| tuhh.publication.institute | Fakultät Technik und Informatik | en_US |
| tuhh.publication.institute | Department Informations- und Elektrotechnik | en_US |
| tuhh.publication.institute | Forschungs- und Transferzentrum Future Air Mobility | en_US |
| tuhh.publisher.doi | 10.1109/AUTOTESTCON47465.2024.10697506 | - |
| tuhh.relation.ispartofseries | 2024 IEEE Autotestcon : conference proceedings | en_US |
| tuhh.type.opus | InProceedings (Aufsatz / Paper einer Konferenz etc.) | - |
| dc.type.casrai | Conference Paper | - |
| dc.type.dini | contributionToPeriodical | - |
| dc.type.driver | contributionToPeriodical | - |
| dc.type.status | info:eu-repo/semantics/publishedVersion | en_US |
| dcterms.DCMIType | Text | - |
| item.creatorGND | Schulz, Peter | - |
| item.creatorGND | Ungar, Louis Y. | - |
| item.creatorGND | Bahrampour, Braum S. | - |
| item.fulltext | No Fulltext | - |
| item.creatorOrcid | Schulz, Peter | - |
| item.creatorOrcid | Ungar, Louis Y. | - |
| item.creatorOrcid | Bahrampour, Braum S. | - |
| item.seriesref | 2024 IEEE Autotestcon : conference proceedings | - |
| item.grantfulltext | none | - |
| item.cerifentitytype | Publications | - |
| item.tuhhseriesid | 2024 IEEE Autotestcon : conference proceedings | - |
| item.languageiso639-1 | en | - |
| item.openairecristype | http://purl.org/coar/resource_type/c_5794 | - |
| item.openairetype | inProceedings | - |
| crisitem.author.dept | Department Informations- und Elektrotechnik | - |
| crisitem.author.orcid | 0009-0009-4830-1498 | - |
| crisitem.author.parentorg | Fakultät Technik und Informatik | - |
| Appears in Collections: | Publications without full text | |
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