| DC Element | Wert | Sprache |
|---|---|---|
| dc.contributor.author | Blum, Fridolin | - |
| dc.contributor.author | Meyer, Philipp | - |
| dc.contributor.author | Lange, Timo | - |
| dc.contributor.author | Trost, Matthis | - |
| dc.contributor.author | Tiedemann, Tim | - |
| dc.date.accessioned | 2025-07-25T09:33:08Z | - |
| dc.date.available | 2025-07-25T09:33:08Z | - |
| dc.date.issued | 2025 | - |
| dc.identifier.isbn | 978-3-7315-1408-4 | en_US |
| dc.identifier.issn | 2510-7240 | en_US |
| dc.identifier.uri | https://hdl.handle.net/20.500.12738/17911 | - |
| dc.description.abstract | Research on autonomous waste detection is primarily focused on conveyor belt systems. Large objects are typically shredded to fit within a conveyor belt system. This work investigates material detection in bulky waste before it is processed by shredders, as sorting large objects before shredding has the potential to improve the recycling process. Multispec-tral cameras are employed to capture high dynamic range images across the ultraviolet, visible, near-infrared, and shortwave infrared spectra. Deep learning techniques are applied for pixel classification and patch segmentation. We evaluate our approach on a small laboratory dataset consisting of 17 images. The results demonstrate that the multispectral imaging approach outperforms RGB-only imaging, achieving a 10% higher accuracy. Furthermore, the study demonstrates that spectral and spatial convolutions enhance the performance of material detection. | en |
| dc.language.iso | en | en_US |
| dc.publisher | KIT Scientific Publishing | en_US |
| dc.subject | Bulky waste | en_US |
| dc.subject | deep learning | en_US |
| dc.subject | material classification | en_US |
| dc.subject | multispectral imaging | en_US |
| dc.subject.ddc | 600: Technik | en_US |
| dc.title | Bulky waste classification from a distance : challenges and first insights | en |
| dc.type | inProceedings | en_US |
| dc.relation.conference | International Conference on Optical Characterization of Materials 2025 | en_US |
| dc.identifier.scopus | 2-s2.0-105005078661 | en |
| dc.description.version | AlternativeReviewed | en_US |
| local.contributorPerson.editor | Beyerer, Jürgen | - |
| local.contributorPerson.editor | Längle, Thomas | - |
| local.contributorPerson.editor | Heizmann, Michael | - |
| tuhh.container.endpage | 294 | en_US |
| tuhh.container.startpage | 285 | en_US |
| tuhh.oai.show | true | en_US |
| tuhh.publication.institute | Department Informatik | en_US |
| tuhh.publication.institute | Fakultät Technik und Informatik | en_US |
| tuhh.publisher.doi | 10.5445/KSP/1000178356 | - |
| tuhh.relation.ispartofseries | Optical Characterization of Materials : Conference proceedings | en_US |
| tuhh.type.opus | InProceedings (Aufsatz / Paper einer Konferenz etc.) | - |
| dc.rights.cc | https://creativecommons.org/licenses/by/4.0/ | en_US |
| dc.type.casrai | Conference Paper | - |
| dc.type.dini | contributionToPeriodical | - |
| dc.type.driver | contributionToPeriodical | - |
| dc.type.status | info:eu-repo/semantics/publishedVersion | en_US |
| dcterms.DCMIType | Text | - |
| dc.source.type | cp | en |
| dc.funding.number | 67KI21013 | en |
| dc.funding.sponsor | Bundesministerium für Umwelt, Naturschutz, nukleare Sicherheit und Verbraucherschutz | en |
| dc.relation.acronym | BMUV | en |
| tuhh.book.title | OCM 2025 : 7th International Conference on Optical Characterization of Materials : March 26th-27th, 2025 : Karlsruhe, Germany | - |
| item.openairetype | inProceedings | - |
| item.languageiso639-1 | en | - |
| item.creatorGND | Blum, Fridolin | - |
| item.creatorGND | Meyer, Philipp | - |
| item.creatorGND | Lange, Timo | - |
| item.creatorGND | Trost, Matthis | - |
| item.creatorGND | Tiedemann, Tim | - |
| item.creatorOrcid | Blum, Fridolin | - |
| item.creatorOrcid | Meyer, Philipp | - |
| item.creatorOrcid | Lange, Timo | - |
| item.creatorOrcid | Trost, Matthis | - |
| item.creatorOrcid | Tiedemann, Tim | - |
| item.cerifentitytype | Publications | - |
| item.openairecristype | http://purl.org/coar/resource_type/c_5794 | - |
| item.tuhhseriesid | Optical Characterization of Materials : Conference proceedings | - |
| item.grantfulltext | none | - |
| item.fulltext | No Fulltext | - |
| item.seriesref | Optical Characterization of Materials : Conference proceedings | - |
| crisitem.author.dept | Department Informatik (ehemalig, aufgelöst 10.2025) | - |
| crisitem.author.dept | Department Informatik (ehemalig, aufgelöst 10.2025) | - |
| crisitem.author.orcid | 0000-0002-6628-7652 | - |
| crisitem.author.parentorg | Fakultät Technik und Informatik (ehemalig, aufgelöst 10.2025) | - |
| crisitem.author.parentorg | Fakultät Technik und Informatik (ehemalig, aufgelöst 10.2025) | - |
| Enthalten in den Sammlungen: | Publications without full text | |
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