| Publisher DOI: | 10.1109/RADECS61970.2024.11298607 | Title: | Bit error rate estimation of modern 3D-NAND flash partitions in space mass memories | Language: | English | Authors: | Dirkes, Timo Spindeldreier, Christian Grürmann, Kai Rust, Jochen  Wyrwoll, Vanessa Poppe, Björn |
Keywords: | NAND Flash; Radiation Effects Mitigation; Scrubbing; Reed Solomon; EDAC; Markov Chain; Bit Error Rate | Issue Date: | 23-Dec-2025 | Publisher: | IEEE | Part of Series: | 2024 24th European Conference on Radiation and Its Effects on Components and Systems (RADECS) | Conference: | European Conference on Radiation and Its Effects on Components and Systems 2024 | Abstract: | A system level bit error rate estimation of a 3D-NAND Flash Partition for different radiation environments and operating modes (SLC/TLC) is performed. Influence of SEFI and SEU effects on bit error rate is characterized. |
URI: | https://hdl.handle.net/20.500.12738/19062 | ISBN: | 979-8-3315-8082-7 979-8-3315-8083-4 |
Review status: | This version was peer reviewed (peer review) | Institute: | Fakultät Informatik und Digitale Gesellschaft | Type: | Chapter/Article (Proceedings) |
| Appears in Collections: | Publications without full text |
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