Publisher DOI: 10.1109/DSD64264.2024.00018
Title: Studying the degradation of propagation delay on FPGAs at the European XFEL
Language: English
Authors: Lanzieri, Leandro 
Butkowski, Lukasz 
Kral, Jiri 
Fey, Goerschwin 
Schlarb, Holger 
Schmidt, Thomas C.  
Editor: Kryjak, Tomasz 
Pétot, Frédéric 
Keywords: Semiconductor device measurement; Switching frequency; Field programmable gate arrays; Embedded hardware; Propagation delay
Issue Date: 2024
Publisher: IEEE
Part of Series: 2024 27th Euromicro Conference on Digital System Design : DSD 2024 : 28-30 August 2024, Paris, France : proceedings 
Startpage: 65
Endpage: 72
Conference: Euromicro Conference on Digital System Design 2024 
URI: https://hdl.handle.net/20.500.12738/19523
ISBN: 979-8-3503-8038-5
979-8-3503-8039-2
ISSN: 2771-2508
Review status: This version was peer reviewed (peer review)
Institute: Department Informatik (ehemalig, aufgelöst 10.2025) 
Fakultät Technik und Informatik (ehemalig, aufgelöst 10.2025) 
Type: Chapter/Article (Proceedings)
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