Publisher DOI: 10.1109/IDAACS68557.2025.11322025
Title: A digital twin for Automatic Test Equipment (ATE) using Field Programmable Gate Arrays (FPGAs)
Language: English
Authors: Schulz, Peter  
Ungar, Louis Y. 
Bahrampour, Braum S. 
Other : Institute of Electrical and Electronics Engineers 
Keywords: ATE; Digital Twin; FPGA
Issue Date: 2025
Publisher: IEEE
Part of Series: The crossing point of intelligent data acquisition & advanced computing systems and East & West scientists : IDAACS '2025 : proceedings of the 13th IEEE International Conference on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications (IDAACS) : 4-6 September, 2025, Gliwice, Poland 
Startpage: 1427
Endpage: 1434
Conference: IEEE International Conference on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications 2025 
URI: https://hdl.handle.net/20.500.12738/19528
ISBN: 979-8-3315-8045-2
979-8-3315-8046-9
979-8-3315-8044-5
ISSN: 2770-4254
Review status: This version was peer reviewed (peer review)
Institute: Department Informations- und Elektrotechnik (ehemalig, aufgelöst 10.2025) 
Fakultät Technik und Informatik (ehemalig, aufgelöst 10.2025) 
Type: Chapter/Article (Proceedings)
Appears in Collections:Publications without full text

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