| Publisher URL: | https://api.elsevier.com/content/abstract/scopus_id/85078537535 | Publisher DOI: | 10.1109/AUTOTESTCON43700.2019.8961895 | Title: | Cyber Physical Test System : A novel approach in testing for the Embedded Systems Industry | Language: | Authors: | Schulz, Peter  Wolff, Carsten |
Other : | Institute of Electrical and Electronics Engineers | Keywords: | ATE; cloud computing; CPS; FPGA; functional testing; IoT; SoPC | Issue Date: | 2019 | Publisher: | IEEE | Part of Series: | 2019 IEEE AUTOTESTCON proceedings | Project: | Cyber Physical Test System | Conference: | IEEE AUTOTESTCON 2019 | URI: | http://hdl.handle.net/20.500.12738/11229 | ISBN: | 978-1-7281-2832-0 978-1-72812-833-7 |
Institute: | Fachhochschule Dortmund | Type: | Chapter/Article (Proceedings) | Funded by: | Bundesministerium für Wirtschaft und Energie |
| Appears in Collections: | Publications without full text |
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