Publisher URL: https://api.elsevier.com/content/abstract/scopus_id/85078537535
Publisher DOI: 10.1109/AUTOTESTCON43700.2019.8961895
Title: Cyber Physical Test System : A novel approach in testing for the Embedded Systems Industry
Language: English
Authors: Schulz, Peter  
Wolff, Carsten 
Other : Institute of Electrical and Electronics Engineers 
Keywords: ATE; cloud computing; CPS; FPGA; functional testing; IoT; SoPC
Issue Date: 2019
Publisher: IEEE
Part of Series: 2019 IEEE AUTOTESTCON proceedings 
Project: Low-cost Cyber-Physical Test System (CPTS) for Embedded Systems Production 
Conference: IEEE AUTOTESTCON 2019 
URI: http://hdl.handle.net/20.500.12738/11229
ISBN: 978-1-7281-2832-0
978-1-72812-833-7
Review status: This version was peer reviewed (peer review)
Institute: Fachhochschule Dortmund 
Type: Chapter/Article (Proceedings)
Funded by: Bundesministerium für Wirtschaft und Energie 
Appears in Collections:Publications without full text

Show full item record

Page view(s)

75
checked on Apr 2, 2025

Google ScholarTM

Check

HAW Katalog

Check

Add Files to Item

Note about this record


Items in REPOSIT are protected by copyright, with all rights reserved, unless otherwise indicated.