DC FieldValueLanguage
dc.contributor.authorRettig, Rasmus-
dc.contributor.authorStolz, Wolfgang-
dc.date.accessioned2021-11-30T15:40:51Z-
dc.date.available2021-11-30T15:40:51Z-
dc.date.issued1998-07-15-
dc.identifier.issn1386-9477en_US
dc.identifier.urihttp://hdl.handle.net/20.500.12738/11975-
dc.language.isoen_USen_US
dc.publisherElsevieren_US
dc.relation.ispartofPhysica. E, Low-dimensional systems & nanostructuresen_US
dc.subjectAtomic force microscopyen_US
dc.subjectEtchingen_US
dc.subjectHeterostructuresen_US
dc.subjectInterfacesen_US
dc.subjectSemiconductorsen_US
dc.subject.ddc530: Physiken_US
dc.titleAtomic scale properties of interior interfaces of semiconductor heterostructures as determined by quasi-digital highly selective etching and atomic force microscopyen_US
dc.typeArticleen_US
openaire.rightshttp://purl.org/coar/access_right/c_14cben_US
tuhh.container.endpage281en_US
tuhh.container.issue1-4en_US
tuhh.container.startpage277en_US
tuhh.container.volume2en_US
tuhh.oai.showtrueen_US
tuhh.publication.institutePhilipps-Universität Marburgen_US
tuhh.publication.institutePhilipps-Universität Marburg. Fachbereich Physiken_US
tuhh.publisher.doi10.1016/S1386-9477(98)00058-7-
tuhh.type.opus(wissenschaftlicher) Artikel-
dc.type.casraiJournal Article-
dc.type.diniarticle-
dc.type.driverarticle-
dc.type.statusinfo:eu-repo/semantics/publishedVersionen_US
dcterms.DCMITypeText-
item.creatorGNDRettig, Rasmus-
item.creatorGNDStolz, Wolfgang-
item.fulltextNo Fulltext-
item.creatorOrcidRettig, Rasmus-
item.creatorOrcidStolz, Wolfgang-
item.grantfulltextnone-
item.cerifentitytypePublications-
item.languageiso639-1en_US-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.openairetypeArticle-
crisitem.author.deptDepartment Informations- und Elektrotechnik-
crisitem.author.parentorgFakultät Technik und Informatik-
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