Atomic scale properties of interior interfaces of semiconductor heterostructures as determined by quasi-digital highly selective etching and atomic force microscopy

Rettig, Rasmus; Stolz, Wolfgang

doi:10.1016/S1386-9477(98)00058-7

DC Element	Wert	Sprache
dc.contributor.author	Rettig, Rasmus	-
dc.contributor.author	Stolz, Wolfgang	-
dc.date.accessioned	2021-11-30T15:40:51Z	-
dc.date.available	2021-11-30T15:40:51Z	-
dc.date.issued	1998-07-15	-
dc.identifier.issn	1386-9477	en_US
dc.identifier.uri	http://hdl.handle.net/20.500.12738/11975	-
dc.language.iso	en_US	en_US
dc.publisher	Elsevier	en_US
dc.relation.ispartof	Physica. E, Low-dimensional systems & nanostructures	en_US
dc.subject	Atomic force microscopy	en_US
dc.subject	Etching	en_US
dc.subject	Heterostructures	en_US
dc.subject	Interfaces	en_US
dc.subject	Semiconductors	en_US
dc.subject.ddc	530: Physik	en_US
dc.title	Atomic scale properties of interior interfaces of semiconductor heterostructures as determined by quasi-digital highly selective etching and atomic force microscopy	en_US
dc.type	Article	en_US
openaire.rights	http://purl.org/coar/access_right/c_14cb	en_US
tuhh.container.endpage	281	en_US
tuhh.container.issue	1-4	en_US
tuhh.container.startpage	277	en_US
tuhh.container.volume	2	en_US
tuhh.oai.show	true	en_US
tuhh.publication.institute	Philipps-Universität Marburg	en_US
tuhh.publication.institute	Philipps-Universität Marburg. Fachbereich Physik	en_US
tuhh.publisher.doi	10.1016/S1386-9477(98)00058-7	-
tuhh.type.opus	(wissenschaftlicher) Artikel	-
dc.type.casrai	Journal Article	-
dc.type.dini	article	-
dc.type.driver	article	-
dc.type.status	info:eu-repo/semantics/publishedVersion	en_US
dcterms.DCMIType	Text	-
item.creatorOrcid	Rettig, Rasmus	-
item.creatorOrcid	Stolz, Wolfgang	-
item.grantfulltext	none	-
item.fulltext	No Fulltext	-
item.openairecristype	http://purl.org/coar/resource_type/c_6501	-
item.openairetype	Article	-
item.creatorGND	Rettig, Rasmus	-
item.creatorGND	Stolz, Wolfgang	-
item.languageiso639-1	en_US	-
item.cerifentitytype	Publications	-
crisitem.author.dept	Department Informations- und Elektrotechnik	-
crisitem.author.parentorg	Fakultät Technik und Informatik	-
Enthalten in den Sammlungen:	Publications without full text