| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Rettig, Rasmus | - |
| dc.contributor.author | Stolz, Wolfgang | - |
| dc.date.accessioned | 2021-11-30T15:40:51Z | - |
| dc.date.available | 2021-11-30T15:40:51Z | - |
| dc.date.issued | 1998-07-15 | - |
| dc.identifier.issn | 1386-9477 | en_US |
| dc.identifier.uri | http://hdl.handle.net/20.500.12738/11975 | - |
| dc.language.iso | en_US | en_US |
| dc.publisher | Elsevier | en_US |
| dc.relation.ispartof | Physica. E, Low-dimensional systems & nanostructures | en_US |
| dc.subject | Atomic force microscopy | en_US |
| dc.subject | Etching | en_US |
| dc.subject | Heterostructures | en_US |
| dc.subject | Interfaces | en_US |
| dc.subject | Semiconductors | en_US |
| dc.subject.ddc | 530: Physik | en_US |
| dc.title | Atomic scale properties of interior interfaces of semiconductor heterostructures as determined by quasi-digital highly selective etching and atomic force microscopy | en_US |
| dc.type | Article | en_US |
| openaire.rights | http://purl.org/coar/access_right/c_14cb | en_US |
| tuhh.container.endpage | 281 | en_US |
| tuhh.container.issue | 1-4 | en_US |
| tuhh.container.startpage | 277 | en_US |
| tuhh.container.volume | 2 | en_US |
| tuhh.oai.show | true | en_US |
| tuhh.publication.institute | Philipps-Universität Marburg | en_US |
| tuhh.publication.institute | Philipps-Universität Marburg. Fachbereich Physik | en_US |
| tuhh.publisher.doi | 10.1016/S1386-9477(98)00058-7 | - |
| tuhh.type.opus | (wissenschaftlicher) Artikel | - |
| dc.type.casrai | Journal Article | - |
| dc.type.dini | article | - |
| dc.type.driver | article | - |
| dc.type.status | info:eu-repo/semantics/publishedVersion | en_US |
| dcterms.DCMIType | Text | - |
| item.creatorGND | Rettig, Rasmus | - |
| item.creatorGND | Stolz, Wolfgang | - |
| item.openairetype | Article | - |
| item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
| item.creatorOrcid | Rettig, Rasmus | - |
| item.creatorOrcid | Stolz, Wolfgang | - |
| item.languageiso639-1 | en_US | - |
| item.grantfulltext | none | - |
| item.cerifentitytype | Publications | - |
| item.fulltext | No Fulltext | - |
| crisitem.author.dept | Department Informations- und Elektrotechnik | - |
| crisitem.author.parentorg | Fakultät Technik und Informatik | - |
| Appears in Collections: | Publications without full text | |
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