Hard X-ray detection using a single 100 nm diameter nanowire

Wallentin, Jesper; Osterhoff, Markus; Wilke, Robin N.; Persson, Karl-Magnus; Wernersson, Lars-Erik; Sprung, Michael; Salditt, Tim

doi:10.1021/nl5040545

Publisher DOI:	10.1021/nl5040545
Title:	Hard X-ray detection using a single 100 nm diameter nanowire
Language:	English
Authors:	Wallentin, Jesper Osterhoff, Markus Wilke, Robin N. Persson, Karl-Magnus Wernersson, Lars-Erik Sprung, Michael Salditt, Tim
Keywords:	Nanowires; X-rays; detector
Issue Date:	24-Nov-2014
Publisher:	American Chemical Society (ACS)
Journal or Series Name:	Nano letters
Volume:	14
Issue:	12
Startpage:	7071
Endpage:	7076
URI:	http://hdl.handle.net/20.500.12738/15607
ISSN:	1530-6992
Review status:	This version was peer reviewed (peer review)
Institute:	Georg-August-Universität Göttingen
Type:	Article
Appears in Collections:	Publications without full text