Hard x-ray nanobeam characterization by coherent diffraction microscopy

Schropp, Andreas; Boye, Pit; Feldkamp, Jan M.; Hoppe, Robert; Patommel, Jens; Samberg, Dirk; Stephan, Sandra; Giewekemeyer, Klaus; Wilke, Robin Niklas; Salditt, Tim; Gulden, Johannes; Mancuso, Adrian P.; Vartanyants, Ivan A.; Weckert, Edgar; Schöder, Sebastian; Burghammer, Manfred; Schroer, Christian G.

doi:10.1063/1.3332591

Publisher DOI:	10.1063/1.3332591
Title:	Hard x-ray nanobeam characterization by coherent diffraction microscopy
Language:	English
Authors:	Schropp, Andreas Boye, Pit Feldkamp, Jan M. Hoppe, Robert Patommel, Jens Samberg, Dirk Stephan, Sandra Giewekemeyer, Klaus Wilke, Robin Niklas Salditt, Tim Gulden, Johannes Mancuso, Adrian P. Vartanyants, Ivan A. Weckert, Edgar Schöder, Sebastian Burghammer, Manfred Schroer, Christian G.
Keywords:	Holographic interferometry; Coherent diffraction; X ray microscopes
Issue Date:	1-Mar-2010
Publisher:	AIP Publishing
Journal or Series Name:	Applied physics letters
Volume:	96
Issue:	9
URI:	http://hdl.handle.net/20.500.12738/15683
ISSN:	1077-3118
Review status:	This version was peer reviewed (peer review)
Institute:	Georg-August-Universität Göttingen
Type:	Article
Additional note:	article number: 091102 (2010)
Appears in Collections:	Publications without full text