Publisher DOI: | 10.1063/1.3332591 | Title: | Hard x-ray nanobeam characterization by coherent diffraction microscopy | Language: | English | Authors: | Schropp, Andreas Boye, Pit Feldkamp, Jan M. Hoppe, Robert Patommel, Jens Samberg, Dirk Stephan, Sandra Giewekemeyer, Klaus Wilke, Robin Niklas ![]() Salditt, Tim Gulden, Johannes Mancuso, Adrian P. Vartanyants, Ivan A. Weckert, Edgar Schöder, Sebastian Burghammer, Manfred Schroer, Christian G. |
Keywords: | Holographic interferometry; Coherent diffraction; X ray microscopes | Issue Date: | 1-Mar-2010 | Publisher: | AIP Publishing | Journal or Series Name: | Applied physics letters | Volume: | 96 | Issue: | 9 | URI: | http://hdl.handle.net/20.500.12738/15683 | ISSN: | 1077-3118 | Review status: | This version was peer reviewed (peer review) | Institute: | Georg-August-Universität Göttingen | Type: | Article | Additional note: | article number: 091102 (2010) |
Appears in Collections: | Publications without full text |
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